Details for: Defects in SiO2 and related dielectrics , science and technology

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Defects in SiO2 and related dielectrics : science and technology / edited by G.Pacchioni, L. Skuja, D.L. Griscom

Secondary Author: Pacchioni, G.;Skuja, L. ;Griscom, D.L.Language: eng.Country: Netherlands, Kingdom of the.Publication: Dordrechet, The Netherlands : Kluwer Academic Publishers, 2000Description: VII, 624 p. : il. ; 25 cmISBN: 0-7923-6686-7.Series: NATO Science Series : Mathematics, Physics and Chemistry, Series II, vol. 2Subject - Topical Name: Silício, Propriedades elétricas | Defeitos cristalinos

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Item type	Current library	Collection	Call number	Copy number	Status	Date due	Barcode
Monografia	Biblioteca NOVA FCT Sala verde/Piso 1	Não Ficção	Q177.NAT FCT 88931 (Browse shelf(Opens below))	1	Available		88666

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