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Defects in SiO2 and related dielectrics, science and technology

Defects in SiO2 and related dielectrics : science and technology / edited by G.Pacchioni, L. Skuja, D.L. Griscom. - Dordrechet, The Netherlands : Kluwer Academic Publishers , 2000 . - VII, 624 p. : il. ; 25 cm. - (NATO Science Series) : Mathematics, Physics and Chemistry. Series II ; vol. 2

ISBN 0-7923-6686-7

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