000 00766nam a2200229 4500
001 8490
010 _a0-387-11372-X
_bencadernado
_dEsc 7 920$
090 _a8490
100 _a19941215d1982 k||y0pory50 ba
101 _aeng
102 _aUS
200 _aSecondary ion mass spectrometry
_eSIMS III
_eproceedings of the third international conference, Technical University, Budapest, August 30-September 5, 1981
_fA. Benninghoven, ed. lit.... [et al.]
210 _aNew York
_cSpringer-Verlag
_d1982
215 _aXI, 444 p.
_cil.
_d25 cm
225 _aSpringer Series in Chemical Physics
_v19
606 _aEspectrometria de massa
680 _aQC454
702 _aBenninghoven
_bA.
_4340
_928630
801 _gRPC
_aPT
942 _2lcc
_cA
_n0