Ion implantation science and technology / J.F. Ziegler, ed. lit.
Language: eng.Country: US - United States of America.Publication: Orlando, US : Academic Press, cop. 1984Description: XI, 635 p. : il. ; 24 cmISBN: 0-12-780620-2.Subject - Topical Name: 37058Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | |
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Monografia | Biblioteca NOVA FCT Sala azul/Piso 2 | Não Ficção | QC702.7.ION FCT 14756 (Browse shelf(Opens below)) | 1 | Available | 0018385 |
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QC702.3.BEY FCT 46491 X-ray radiation of highly charged ions | QC702.3.BRO FCT 17181 The physics and technology of ion sources | QC702.3.ZHA FCT 48402 Ion sources | QC702.7.ION FCT 14756 Ion implantation science and technology | QC702.7.NAT FCT 12298 Site characterization and aggregation of implanted atoms in materials | QC702.7.NAT FCT 12358 Material characterization using ion beams, lectures presented at the NATO Advanced Study Institute on Material Characterization Using Ion Beams held in Aleria, Corsica, August 29-September 12, 1976 | QC705.CLU FCT 12108 L'arc électrique et ses applications, tome 1, étude physique de l'arc électrique |
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