Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
Language: eng.Country: US - United States of America.Publication: New York : IEEE Press, cop. 1990Description: XVII, 652 p. : il. ; 26 cmISBN: 0-7803-1062-4.Subject - Topical Name: 12635 | 12342| Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|
| Monografia | Biblioteca NOVA FCT Sala azul/Piso 2 | Não Ficção | TK7874.ABR FCT 48121 (Browse shelf(Opens below)) | 1 | Available | 0030602 |
Browsing Biblioteca NOVA FCT shelves, Shelving location: Sala azul/Piso 2, Collection: Não Ficção Close shelf browser (Hides shelf browser)
| TK7874.8.GOS FCT 58404 Nanoelectronics and nanosystems, from transistors to molecular and quantum devices | TK7874.8.MOL FCT 58773 Molecular electronics, bio-sensors and bio-computers | TK7874.88.BIM FCT 46866 Quantum dot heterostructures | TK7874.ABR FCT 48121 Digital systems testing and testable design | TK7874.ALL FCT 55310 CMOS Analog Circuit Design | TK7874.ALL FCT 67846 CMOS analog circuit design | TK7874.ANA FCT 65194 Analog circuit design |
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