Secondary ion mass spectrometry : SIMS III : proceedings of the third international conference, Technical University, Budapest, August 30-September 5, 1981 / A. Benninghoven, ed. lit.... [et al.].
- New York : Springer-Verlag , 1982 .
- XI, 444 p. : il. ; 25 cm.
- (Springer Series in Chemical Physics)
; 19
ISBN 0-387-11372-X
Espectrometria de massa
LCC QC454
ISBN 0-387-11372-X
Espectrometria de massa
LCC QC454
