Advances in X-ray analysis : proceedings of the tenth annual conference on application of X-ray analysis held August 7-9, 1961t / edited by William M. Mueller.
- New York : Plenum Press , cop. 1962 .
- XI, 564 p. : il. ; 26 cm.
ISBN
Raios X
LCC TA406.5
ISBN
Raios X
LCC TA406.5