Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 / A. Benninghoven, ed. lit. ... [et al.].
- New York : Springer-Verlag , 1984 .
- XV, 503 p. : il. ; 24 cm.
- (Springer series in chemical physics)
; 36
ISBN 0-387-13316-X
Espectrometria de massa
LCC QC454
ISBN 0-387-13316-X
Espectrometria de massa
LCC QC454
