Eberhart, J. P.
Structural and chemical analysis of materials : X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy / J. P. Eberhart. - New York : John Wiley & Sons , cop. 1991 . - XXX, 545 p. : il. ; 25 cm.
ISBN 0-471-95014-9
Materiais
Microestruturas
LCC TA417.23
Structural and chemical analysis of materials : X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy / J. P. Eberhart. - New York : John Wiley & Sons , cop. 1991 . - XXX, 545 p. : il. ; 25 cm.
ISBN 0-471-95014-9
Materiais
Microestruturas
LCC TA417.23
